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ALL CATEGORIES   Semiconductor Mfg   Metrology Eq   Film Thickness

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Item ID: 249589

2 Offered at Best Price KLA-Tencor ASET-F5x Thin Film Measurement System KLA-TENCOR ASET-F5x Thin Film Measurement System Serial Number 0202802R Manufactured in June, 2002 Inspection Modes Include: Dual Beam Spectrometry Spectroscopic Ellipsometry Film Stress Analysis SUMMIT™ Application Software Version 3.21.16 FTML Version 3.46.06 Model 300DFF1P Wafer Loading Platform Dual Loadports for 300mm Wafers Three Axis Wafer Handling Robot GEM / SECS Communication Inquire for Additional Details   ... other images

Location: Austin, Texas

Unit Price	Unstated
Number of Units	2
Manufacturer	KLA-Tencor
Model	ASET-F5x
Description	Thin Film Measurement System
Wafer Size Range
Minimum	200 mm
Maximum	300 mm
Set Size	300 mm
Illumination Source Type	Multi-wavelength Source
Multi-Layer Film Capacity	YES
Micro Spot Optics	YES
Scanning Stage	YES
Wafer Mapping	YES
Software Revision Level	SUMMIT 3.21.16
Condition	Excellent
Year of Manufacture	2002
Refurbished	YES
CE Marked	YES

OFFERED BY:

(click name below to visit its website directly)
Catalyst Equipment Corporation
Plano , Texas
+1.972.943.0808

 

Deal directly with Owner:  Catalyst Equipment Corporation of Plano, Texas   Make OFFERSend INQUIRY